Menu
Mon panier

En cours de chargement...

Recherche avancée

HIGH-RESOLUTION ELECTRON MICROSCOPY FOR MATERIALS SCIENCE (Broché)

K Hiraga, Daisuke Shindo

  • Springer

  • Paru le : 18/12/1998
High-resolution electron microscopy (MREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale... > Lire la suite
  • Plus d'un million de livres disponibles
  • Retrait gratuit en magasin
  • Livraison à domicile sous 24h/48h*
    * si livre disponible en stock, livraison payante
68,45 €
Expédié sous 6 à 12 jours
  • ou
    À retirer gratuitement en magasin U
    entre le 29 mai et le 5 juin
High-resolution electron microscopy (MREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulation-indispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Fiche technique

  • Date de parution : 18/12/1998
  • Editeur : Springer
  • ISBN : 4431702342
  • EAN : 9784431702344
  • Présentation : Broché
  • Nb. de pages : 189 pages
  • Poids : 0.61 Kg
  • Dimensions : 19,4 cm × 27,0 cm × 1,0 cm
K Hiraga et Daisuke Shindo - HIGH-RESOLUTION ELECTRON MICROSCOPY FOR MATERIALS SCIENCE.
HIGH-RESOLUTION ELECTRON MICROSCOPY FOR MATERIALS SCIENCE
K Hiraga, ...
68,45 €
Haut de page