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An Introduction To Surfaces Analysis By Xps And Aes (Broché)
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Résumé
An Introduction to Surface Analysis by XPS and AES is a clear and accessible introduction to the key electron spectroscopic techniques used in surface analysis. Starting with an introduction to the basic concepts of electron spectroscopy, the text moues on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complementary methods have been included to provide an up-to-date account of these widely used techniques.
Sommaire
- Electron Spectroscopy : Some Basic Concepts
- Electron Spectrometer Design
- The Electron Spectrum : Qualitative and Quantitaive Interpretation
- Compositional Depth Profiling
- Applications of Electron Spectroscopy in Materials Science
- Comparison of XPS and AES with Other Analytical Techniques.
Fiche technique
- Date de parution : 01/04/2003
- Editeur : Wiley
- ISBN : 0-470-84713-1
- EAN : 9780470847138
- Présentation : Broché
- Nb. de pages : 212 pages
- Poids : 0.4 Kg
- Dimensions : 15,2 cm × 23,0 cm × 1,5 cm
À propos de l'auteur
Biographie de John-F Watts
John F Watts is Professor of Adhesion Science in the School of Engineering at the University of Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis. John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.An Introduction To Surfaces Analysis By Xps And Aes est également présent dans les rayons
An Introduction To Surfaces Analysis By Xps And...
86,50 €